Study of Contact Resistance Components in Short-Channel Indium-Gallium-Zinc-Oxide Transistor
Hongwei Tang; Harold Dekkers; Nouredine Rassoul; Surajit Sutar; Subhali Subhechha; Valeri Afanas’ev; Jan Van Houdt; Romain Delhougne; Gouri Sankar Kar; Attilio Belmonte
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Electron Devices
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/ted.2023.3332057
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Cite this source
Hongwei Tang; Harold Dekkers; Nouredine Rassoul; Surajit Sutar; Subhali Subhechha; Valeri Afanas’ev; Jan Van Houdt; Romain Delhougne; Gouri Sankar Kar; Attilio Belmonte. Study of Contact Resistance Components in Short-Channel Indium-Gallium-Zinc-Oxide Transistor. IEEE Transactions on Electron Devices. 2024-01. https://doi.org/10.1109/ted.2023.3332057