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Research literature / Preprint / posted paper

Semiconductor Wafer Map Defect Classification with Tiny Vision Transformers

Faisal Mohammad; Duksan Ryu

Published
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Research area
Semiconductors
Source type
Preprint / posted paper
DOI
10.36227/techrxiv.174284964.40200770/v1

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Faisal Mohammad; Duksan Ryu. Semiconductor Wafer Map Defect Classification with Tiny Vision Transformers. Institute of Electrical and Electronics Engineers (IEEE). 2025-03-24. https://doi.org/10.36227/techrxiv.174284964.40200770/v1

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