Statistical Analysis of Power Semiconductor Devices Lifetime Test and Lifetime Prediction
Xia Zhou; Zhicheng Xin; Zan Wu; Kuang Sheng
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Journal of Emerging and Selected Topics in Power Electronics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/jestpe.2024.3495993
The original publisher provides the full text and its access options.
Cite this source
Xia Zhou; Zhicheng Xin; Zan Wu; Kuang Sheng. Statistical Analysis of Power Semiconductor Devices Lifetime Test and Lifetime Prediction. IEEE Journal of Emerging and Selected Topics in Power Electronics. 2025-02. https://doi.org/10.1109/jestpe.2024.3495993