The Electrical Characterization of TeO 2 -based Metal-Oxide-Semiconductor Devices
Ebru Dönmez; Osman Pakma; Şadan Özden; Nejmettin Avcı; Pınar Özden; İshak. Afşin Kariper
- Published
- Publisher
- The Electrochemical Society
- Journal / collection
- ECS Journal of Solid State Science and Technology
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1149/2162-8777/adc6ba
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Cite this source
Ebru Dönmez; Osman Pakma; Şadan Özden; Nejmettin Avcı; Pınar Özden; İshak. Afşin Kariper. The Electrical Characterization of TeO 2 -based Metal-Oxide-Semiconductor Devices. ECS Journal of Solid State Science and Technology. 2025-04-01. https://doi.org/10.1149/2162-8777/adc6ba