A Remaining Useful Life Prediction Method for Insulated-Gate Bipolar Transistor Based on Deep Fusion of Nonlinear Features From Multisource Data
Gaige Chen; Xiaoyu Hao; Jun Huang; Hongbo Ma; Xianzhi Wang; Xianguang Kong
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Sensors Journal
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/jsen.2024.3471675
The original publisher provides the full text and its access options.
Cite this source
Gaige Chen; Xiaoyu Hao; Jun Huang; Hongbo Ma; Xianzhi Wang; Xianguang Kong. A Remaining Useful Life Prediction Method for Insulated-Gate Bipolar Transistor Based on Deep Fusion of Nonlinear Features From Multisource Data. IEEE Sensors Journal. 2024-11-15. https://doi.org/10.1109/jsen.2024.3471675