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Research literature / Journal article

Analysis of Transient Response of Negative Capacitance Field-Effect Transistor

Dong Keun Lee; Seungwon Go; Jae Yeon Park; Hyungju Noh; Jiwoong Choi; Jangsaeng Kim; Sihyun Kim; Sangwan Kim

Published
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Journal / collection
IEEE Access
Research area
Semiconductors
Source type
Journal article
DOI
10.1109/access.2025.3647663

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Dong Keun Lee; Seungwon Go; Jae Yeon Park; Hyungju Noh; Jiwoong Choi; Jangsaeng Kim; Sihyun Kim; Sangwan Kim. Analysis of Transient Response of Negative Capacitance Field-Effect Transistor. IEEE Access. 2025. https://doi.org/10.1109/access.2025.3647663

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