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Research literature / Conference paper

SRAM Physically Unclonable Function Extracting Static Entropy from Every Bitcell Transistor for 6 bit/bitcell and Data Fingerprinting Capability for Provenance Assurance

Tianqi Wang; Joydeep Basu; Viveka Konandur Rajanna; Massimo Alioto

Published
Publisher
IEEE
Journal / collection
2024 IEEE Asian Solid-State Circuits Conference (A-SSCC)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/a-sscc60305.2024.10848665

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Tianqi Wang; Joydeep Basu; Viveka Konandur Rajanna; Massimo Alioto. SRAM Physically Unclonable Function Extracting Static Entropy from Every Bitcell Transistor for 6 bit/bitcell and Data Fingerprinting Capability for Provenance Assurance. 2024 IEEE Asian Solid-State Circuits Conference (A-SSCC). 2024-11-18. https://doi.org/10.1109/a-sscc60305.2024.10848665

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