Process dispersion monitoring: Innovative AEWMA control chart in semiconductor manufacturing
Imad Khan; Muhammad Noor-ul-Amin; Muhammad Usman Aslam; Almetwally M. Mostafa; Bakhtiyar Ahmad
- Published
- Publisher
- AIP Publishing
- Journal / collection
- AIP Advances
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1063/5.0190533
The original publisher provides the full text and its access options.
Cite this source
Imad Khan; Muhammad Noor-ul-Amin; Muhammad Usman Aslam; Almetwally M. Mostafa; Bakhtiyar Ahmad. Process dispersion monitoring: Innovative AEWMA control chart in semiconductor manufacturing. AIP Advances. 2024-01-01. https://doi.org/10.1063/5.0190533