Manufacturing Flaw Forecasting via CNN-RF Fusion Techniques
Deepak Banerjee; Neha Sharma; Deepak Upadhyay; Vijay Singh
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 2nd World Conference on Communication & Computing (WCONF)
- Research area
- Industrial systems
- Source type
- Conference paper
- DOI
- 10.1109/wconf61366.2024.10692238
The original publisher provides the full text and its access options.
Cite this source
Deepak Banerjee; Neha Sharma; Deepak Upadhyay; Vijay Singh. Manufacturing Flaw Forecasting via CNN-RF Fusion Techniques. 2024 2nd World Conference on Communication & Computing (WCONF). 2024-07-12. https://doi.org/10.1109/wconf61366.2024.10692238