ESD Induced Irreversible Degradation Processes in the Semiconductor Devices
Vadim Kuznetsov; Vladimir Andreev
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 6th International Youth Conference on Radio Electronics, Electrical and Power Engineering (REEPE)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/reepe60449.2024.10479847
The original publisher provides the full text and its access options.
Cite this source
Vadim Kuznetsov; Vladimir Andreev. ESD Induced Irreversible Degradation Processes in the Semiconductor Devices. 2024 6th International Youth Conference on Radio Electronics, Electrical and Power Engineering (REEPE). 2024-02-29. https://doi.org/10.1109/reepe60449.2024.10479847