Total X-ray dose effect on graphene field effect transistor
Ji-Fang Li; Hong-Xia Guo; Wu-Ying Ma; Hong-Jia Song; Xiang-Li Zhong; Yang-Fan Li; Ru-Xue Bai; Xiao-Jie Lu; Feng-Qi Zhang; School of Materials Science and Engineering, Xiangtan University, Xiangtan 411105, China; Northwest Institute of Nuclear Technology, Xi’an 710024, China
- Published
- Publisher
- Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
- Journal / collection
- Acta Physica Sinica
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.7498/aps.73.20231829
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Cite this source
Ji-Fang Li; Hong-Xia Guo; Wu-Ying Ma; Hong-Jia Song; Xiang-Li Zhong; Yang-Fan Li; Ru-Xue Bai; Xiao-Jie Lu; Feng-Qi Zhang; School of Materials Science and Engineering, Xiangtan University, Xiangtan 411105, China; Northwest Institute of Nuclear Technology, Xi’an 710024, China. Total X-ray dose effect on graphene field effect transistor. Acta Physica Sinica. 2024. https://doi.org/10.7498/aps.73.20231829