Optimizing Neural Network Testing with Test Theory
Yifei Liu; Yinxiao Miao; Ping Yang; Tianqi Wan; Xiujian Zhang; Long Zhang
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 4th International Conference on Neural Networks, Information and Communication (NNICE)
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1109/nnice61279.2024.10498351
The original publisher provides the full text and its access options.
Cite this source
Yifei Liu; Yinxiao Miao; Ping Yang; Tianqi Wan; Xiujian Zhang; Long Zhang. Optimizing Neural Network Testing with Test Theory. 2024 4th International Conference on Neural Networks, Information and Communication (NNICE). 2024-01-19. https://doi.org/10.1109/nnice61279.2024.10498351