Self-Heating and Process Induced Performance Barrier on Complementary Field Effect Transistor: A Reliability Perspective
Sandeep Kumar; Deven H Patil; Khushi Jain; Ankit Dixit; Sunil Rathore; Mohd. Shakir; Naveen Kumar; Vihar Georgiev; S. Dasgupta; Navjeet Bagga
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 9th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/edtm61175.2025.11041030
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Cite this source
Sandeep Kumar; Deven H Patil; Khushi Jain; Ankit Dixit; Sunil Rathore; Mohd. Shakir; Naveen Kumar; Vihar Georgiev; S. Dasgupta; Navjeet Bagga. Self-Heating and Process Induced Performance Barrier on Complementary Field Effect Transistor: A Reliability Perspective. 2025 9th IEEE Electron Devices Technology & Manufacturing Conference (EDTM). 2025-03. https://doi.org/10.1109/edtm61175.2025.11041030