A Bit-Cell Failure Analysis Framework for Ferroelectric Field-Effect Transistor-Based Memories
Jianze Wang; Wei Zhang; Xuanyao Fong
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/jxcdc.2025.3616007
The original publisher provides the full text and its access options.
Cite this source
Jianze Wang; Wei Zhang; Xuanyao Fong. A Bit-Cell Failure Analysis Framework for Ferroelectric Field-Effect Transistor-Based Memories. IEEE Journal on Exploratory Solid-State Computational Devices and Circuits. 2025. https://doi.org/10.1109/jxcdc.2025.3616007