Stress and temperature analysis in semiconductor devices using multi-mode Raman thermography
Elza Kalniņa
- Published
- Publisher
- AkiNik Publications
- Journal / collection
- International Journal of Electronics and Microcircuits
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.22271/27084493.2024.v4.i2a.54
The original publisher provides the full text and its access options.
Cite this source
Elza Kalniņa. Stress and temperature analysis in semiconductor devices using multi-mode Raman thermography. International Journal of Electronics and Microcircuits. 2024-07-01. https://doi.org/10.22271/27084493.2024.v4.i2a.54