SiGe/Si Heterojunction Drain Transistor for Faster 3D NAND Flash Memory Erase
Dasom Lee; Tsu-Jae King Liu
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IEEE International Memory Workshop (IMW)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/imw59701.2024.10536942
The original publisher provides the full text and its access options.
Cite this source
Dasom Lee; Tsu-Jae King Liu. SiGe/Si Heterojunction Drain Transistor for Faster 3D NAND Flash Memory Erase. 2024 IEEE International Memory Workshop (IMW). 2024-05-12. https://doi.org/10.1109/imw59701.2024.10536942