Optimizing Semiconductor Testing: Leveraging Stuck-At Fault Models for Efficient Fault Coverage
Vijayaprabhuvel Rajavel
- Published
- Publisher
- Internal Journals Publication House
- Journal / collection
- International Journal of Latest Engineering and Management Research (IJLEMR)
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.56581/ijlemr.10.02.69-76
The original publisher provides the full text and its access options.
Cite this source
Vijayaprabhuvel Rajavel. Optimizing Semiconductor Testing: Leveraging Stuck-At Fault Models for Efficient Fault Coverage. International Journal of Latest Engineering and Management Research (IJLEMR). 2025-03-04. https://doi.org/10.56581/ijlemr.10.02.69-76