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Research literature / Conference paper

Analysis and Characterization Techniques for Wide Band Gap Semiconductor Materials

Yan Liu; Yupu Wang; Siming Wang; Kaixuan Li; Ting Zhang; Qiong Zhang; Anli Yang; Bing Yang; Qichao Ding; Zhihong Mai

Published
Publisher
IEEE
Journal / collection
2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/ipfa61654.2024.10690925

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Yan Liu; Yupu Wang; Siming Wang; Kaixuan Li; Ting Zhang; Qiong Zhang; Anli Yang; Bing Yang; Qichao Ding; Zhihong Mai. Analysis and Characterization Techniques for Wide Band Gap Semiconductor Materials. 2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). 2024-07-15. https://doi.org/10.1109/ipfa61654.2024.10690925

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