Semiconductor Application Fail Root Causes And Secure Test Remedy
Heguo Yin; Peter Poechmueller
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IEEE European Test Symposium (ETS)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/ets61313.2024.10567545
The original publisher provides the full text and its access options.
Cite this source
Heguo Yin; Peter Poechmueller. Semiconductor Application Fail Root Causes And Secure Test Remedy. 2024 IEEE European Test Symposium (ETS). 2024-05-20. https://doi.org/10.1109/ets61313.2024.10567545