MONITORING THE HOMOGENEITY OF SEMICONDUCTOR FILMS DURING PROBE MEASUREMENTS OF ELECTRICAL CONDUCTIVITY
Lipetsk State Technical University; A.A. ZAVOROTNII; A.A. ERSHOV; N.N. Krasovskii Institute of Mathematics and Mechanics of the Ural Branch of the Russian Academy of Sciences; V.V. FILIPPOV; Lipetsk State Pedagogical P. Semenov-Tyan-Shansky University; S.E. LUZYANIN; Lipetsk State Pedagogical P. Semenov-Tyan-Shansky University; Lipetsk Cossack Institute of Technology and Management (branch) of the Moscow State University of Technology and Management named after K.G. Razumovsky (First Cossack University)
- Published
- Publisher
- Tomsk State University
- Journal / collection
- Izvestiya vysshikh uchebnykh zavedenii. Fizika
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.17223/00213411/68/2/9
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Cite this source
Lipetsk State Technical University; A.A. ZAVOROTNII; A.A. ERSHOV; N.N. Krasovskii Institute of Mathematics and Mechanics of the Ural Branch of the Russian Academy of Sciences; V.V. FILIPPOV; Lipetsk State Pedagogical P. Semenov-Tyan-Shansky University; S.E. LUZYANIN; Lipetsk State Pedagogical P. Semenov-Tyan-Shansky University; Lipetsk Cossack Institute of Technology and Management (branch) of the Moscow State University of Technology and Management named after K.G. Razumovsky (First Cossack University). MONITORING THE HOMOGENEITY OF SEMICONDUCTOR FILMS DURING PROBE MEASUREMENTS OF ELECTRICAL CONDUCTIVITY. Izvestiya vysshikh uchebnykh zavedenii. Fizika. 2025. https://doi.org/10.17223/00213411/68/2/9