Fractional-order equivalent impedance model for junction-case thermal characteristics of insulated gate bipolar transistor modules
Hanrui Shang; Changzheng Deng; Fei Chen; Nan Zhang; Zhen Feng; Xi Chen
- Published
- Publisher
- Emerald
- Journal / collection
- COMPEL - The international journal for computation and mathematics in electrical and electronic engineering
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1108/compel-08-2024-0340
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Cite this source
Hanrui Shang; Changzheng Deng; Fei Chen; Nan Zhang; Zhen Feng; Xi Chen. Fractional-order equivalent impedance model for junction-case thermal characteristics of insulated gate bipolar transistor modules. COMPEL - The international journal for computation and mathematics in electrical and electronic engineering. 2025-03-11. https://doi.org/10.1108/compel-08-2024-0340