Subsystem Reliability Analysis of Data Center Network BCube
Yihong Wang; Weibei Fan; Jianxi Fan; Jingya Zhou; Baolei Cheng
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Reliability
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.1109/tr.2024.3381160
The original publisher provides the full text and its access options.
Cite this source
Yihong Wang; Weibei Fan; Jianxi Fan; Jingya Zhou; Baolei Cheng. Subsystem Reliability Analysis of Data Center Network BCube. IEEE Transactions on Reliability. 2024-12. https://doi.org/10.1109/tr.2024.3381160