Skip to content
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Journal article

A fast ramp-up framework for wafer yield improvement in semiconductor manufacturing systems

Hong-Wei Xu; Qi-Hua Zhang; Yan-Ning Sun; Qun-Long Chen; Wei Qin; You-Long Lv; Jie Zhang

Published
Publisher
Elsevier BV
Journal / collection
Journal of Manufacturing Systems
Research area
Semiconductors
Source type
Journal article
DOI
10.1016/j.jmsy.2024.07.001

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Hong-Wei Xu; Qi-Hua Zhang; Yan-Ning Sun; Qun-Long Chen; Wei Qin; You-Long Lv; Jie Zhang. A fast ramp-up framework for wafer yield improvement in semiconductor manufacturing systems. Journal of Manufacturing Systems. 2024-10. https://doi.org/10.1016/j.jmsy.2024.07.001

Download RIS