Transmission Line Pulse Setup for Electrostatic Discharge Robustness Testing of the Semiconductor Devices
V. V. Kuznetsov; V. V. Andreev
- Published
- Publisher
- Pleiades Publishing Ltd
- Journal / collection
- Instruments and Experimental Techniques
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1134/s0020441224700453
The original publisher provides the full text and its access options.
Cite this source
V. V. Kuznetsov; V. V. Andreev. Transmission Line Pulse Setup for Electrostatic Discharge Robustness Testing of the Semiconductor Devices. Instruments and Experimental Techniques. 2024-04. https://doi.org/10.1134/s0020441224700453