Analysis of metal and zinc oxide semiconductor interface resistance using transmission line method
Do-Yeon Lee; Woon-San Ko; Ki-Nam Kim; Jun-Ho Byun; Eun-Gi Kim; So-Yeon Kwon; Ga-Won Lee
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Solid-State Electronics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.sse.2024.108916
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Cite this source
Do-Yeon Lee; Woon-San Ko; Ki-Nam Kim; Jun-Ho Byun; Eun-Gi Kim; So-Yeon Kwon; Ga-Won Lee. Analysis of metal and zinc oxide semiconductor interface resistance using transmission line method. Solid-State Electronics. 2024-06. https://doi.org/10.1016/j.sse.2024.108916