Probing Interface Defect Formation in Halide Perovskite Semiconductor Devices
Philip Schulz
- Published
- Publisher
- FUNDACIO DE LA COMUNITAT VALENCIANA SCITO
- Journal / collection
- Proceedings of the Materials for Sustainable Development Conference (MATSUS Fall 24)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.29363/nanoge.matsusfall.2024.209
The original publisher provides the full text and its access options.
Cite this source
Philip Schulz. Probing Interface Defect Formation in Halide Perovskite Semiconductor Devices. Proceedings of the Materials for Sustainable Development Conference (MATSUS Fall 24). 2024-08-28. https://doi.org/10.29363/nanoge.matsusfall.2024.209