Addressing the Combined Effect of Transistor and Interconnect Aging in SRAM towards Silicon Lifecycle Management
Zhe Zhang; Mahta Mayahinia; Christian Weis; Norbert Wehn; Mehdi Tahoori; Sani Nassif; Grigor Tshagharyan; Gurgen Harutyunyan; Yervant Zorian
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IEEE 42nd VLSI Test Symposium (VTS)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/vts60656.2024.10538862
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Cite this source
Zhe Zhang; Mahta Mayahinia; Christian Weis; Norbert Wehn; Mehdi Tahoori; Sani Nassif; Grigor Tshagharyan; Gurgen Harutyunyan; Yervant Zorian. Addressing the Combined Effect of Transistor and Interconnect Aging in SRAM towards Silicon Lifecycle Management. 2024 IEEE 42nd VLSI Test Symposium (VTS). 2024-04-22. https://doi.org/10.1109/vts60656.2024.10538862