Skip to content
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Conference paper

Applying Machine Learning to Predict Software Defects

Samruddhi Bhaskar Mohite; Pallavi Semwal; John Anand; Madan Mohan Sati; Aniket Singh; Neha Tripathi

Published
Publisher
IEEE
Journal / collection
2024 International Conference on Advances in Computing, Communication and Materials (ICACCM)
Research area
AI & compute
Source type
Conference paper
DOI
10.1109/icaccm61117.2024.11059225

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Samruddhi Bhaskar Mohite; Pallavi Semwal; John Anand; Madan Mohan Sati; Aniket Singh; Neha Tripathi. Applying Machine Learning to Predict Software Defects. 2024 International Conference on Advances in Computing, Communication and Materials (ICACCM). 2024-11-22. https://doi.org/10.1109/icaccm61117.2024.11059225

Download RIS