Low-power edge detection based on ferroelectric field-effect transistor
Jiajia Chen; Jiacheng Xu; Jiani Gu; Bowen Chen; Hongrui Zhang; Haoji Qian; Huan Liu; Rongzong Shen; Gaobo Lin; Xiao Yu; Miaomiao Zhang; Yi’an Ding; Yan Liu; Jianshi Tang; Huaqiang Wu; Chengji Jin; Genquan Han
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Nature Communications
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1038/s41467-024-55224-8
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Jiajia Chen; Jiacheng Xu; Jiani Gu; Bowen Chen; Hongrui Zhang; Haoji Qian; Huan Liu; Rongzong Shen; Gaobo Lin; Xiao Yu; Miaomiao Zhang; Yi’an Ding; Yan Liu; Jianshi Tang; Huaqiang Wu; Chengji Jin; Genquan Han. Low-power edge detection based on ferroelectric field-effect transistor. Nature Communications. 2025-01-10. https://doi.org/10.1038/s41467-024-55224-8