Indirect Thermographic Measurement of the Temperature of a Transistor Die during Pulse Operation
Arkadiusz Hulewicz; Krzysztof Dziarski; Łukasz Drużyński
- Published
- Publisher
- MDPI AG
- Journal / collection
- Sensors
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.3390/s24196452
The original publisher provides the full text and its access options.
Cite this source
Arkadiusz Hulewicz; Krzysztof Dziarski; Łukasz Drużyński. Indirect Thermographic Measurement of the Temperature of a Transistor Die during Pulse Operation. Sensors. 2024-10-06. https://doi.org/10.3390/s24196452