Microwave Photoconductance Spectrometer for Thin-Film Deposited Semiconductor Materials
Kyle Lu; Gregory Horner; Bryon Larson; Obadiah Reid; Michael Heben; Adam Phillips; Randall Ellingson; Tyler Brau
- Published
- Publisher
- Office of Scientific and Technical Information (OSTI)
- Research area
- Semiconductors
- Source type
- Report
- DOI
- 10.2172/2466321
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Cite this source
Kyle Lu; Gregory Horner; Bryon Larson; Obadiah Reid; Michael Heben; Adam Phillips; Randall Ellingson; Tyler Brau. Microwave Photoconductance Spectrometer for Thin-Film Deposited Semiconductor Materials. Office of Scientific and Technical Information (OSTI). 2024-10-14. https://doi.org/10.2172/2466321