Temperature-Dependent Hydrogen Modulations of Ultra-Scaled a-IGZO Thin Film Transistor Under Gate Bias Stress
Muhammad Aslam; Shu-Wei Chang; Min-Hui Chuang; Yi-Ho Chen; Yao-Jen Lee; Yiming Li
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Open Journal of Nanotechnology
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/ojnano.2024.3386123
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Cite this source
Muhammad Aslam; Shu-Wei Chang; Min-Hui Chuang; Yi-Ho Chen; Yao-Jen Lee; Yiming Li. Temperature-Dependent Hydrogen Modulations of Ultra-Scaled a-IGZO Thin Film Transistor Under Gate Bias Stress. IEEE Open Journal of Nanotechnology. 2024. https://doi.org/10.1109/ojnano.2024.3386123