Analysis of high frequency characteristics dependence of 90nm SOI CMOS technology based circuits on design parameters of transistor interconnects
Alexey Mosharov
- Published
- Publisher
- Akademizdatcenter Nauka
- Journal / collection
- Электронная техника Серия 3 Микроэлектроника
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.7868/s2410993225020058
The original publisher provides the full text and its access options.
Cite this source
Alexey Mosharov. Analysis of high frequency characteristics dependence of 90nm SOI CMOS technology based circuits on design parameters of transistor interconnects. Электронная техника Серия 3 Микроэлектроника. 2025. https://doi.org/10.7868/s2410993225020058