A Study of Device Parameters Affecting the Current Error Rate in a Low-Temperature Polycrystalline Silicon Thin-Film Transistor Pixel Circuit for Active-Matrix Organic Light-Emitting Diode Display Applications
Kook Chul Moon; Jae-Hong Jeon; KeeChan Park
- Published
- Publisher
- MDPI AG
- Journal / collection
- Electronics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.3390/electronics13234810
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Cite this source
Kook Chul Moon; Jae-Hong Jeon; KeeChan Park. A Study of Device Parameters Affecting the Current Error Rate in a Low-Temperature Polycrystalline Silicon Thin-Film Transistor Pixel Circuit for Active-Matrix Organic Light-Emitting Diode Display Applications. Electronics. 2024-12-05. https://doi.org/10.3390/electronics13234810