Effects of Heat-Treatment on the Population of Intrinsic Defects in and the Stability of an Amorphous Metal-Oxide Thin-Film Transistor
Yuqi Wang; Zhihe Xia; Man Wong
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Electron Device Letters
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/led.2023.3345356
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Cite this source
Yuqi Wang; Zhihe Xia; Man Wong. Effects of Heat-Treatment on the Population of Intrinsic Defects in and the Stability of an Amorphous Metal-Oxide Thin-Film Transistor. IEEE Electron Device Letters. 2024-02. https://doi.org/10.1109/led.2023.3345356