Study on the Off-State Breakdown Mechanism and Performance of Copolymer Lateral Drift Region-Organic Field-Effect Transistor Using TCAD Tool
Jun Zhang; Xin Wu; Haonan Lin; Lei Wang; Hao Zhang; Fubin Wang; Man Li; Chenyang Huang; Jing Chen; Maolin Zhang; Jiafei Yao; Guobin Zhang; Song Bai; Yufeng Guo
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Electron Devices
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/ted.2024.3442190
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Cite this source
Jun Zhang; Xin Wu; Haonan Lin; Lei Wang; Hao Zhang; Fubin Wang; Man Li; Chenyang Huang; Jing Chen; Maolin Zhang; Jiafei Yao; Guobin Zhang; Song Bai; Yufeng Guo. Study on the Off-State Breakdown Mechanism and Performance of Copolymer Lateral Drift Region-Organic Field-Effect Transistor Using TCAD Tool. IEEE Transactions on Electron Devices. 2024-10. https://doi.org/10.1109/ted.2024.3442190