Review on the Thermal Models Applications in the Reliability of Power Semiconductor Device
Jun Zhang; Huixian Shen; Haiyan Sun; Zhihuan Wang
- Published
- Publisher
- Institution of Engineering and Technology (IET)
- Journal / collection
- IET Power Electronics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1049/pel2.70065
The original publisher provides the full text and its access options.
Cite this source
Jun Zhang; Huixian Shen; Haiyan Sun; Zhihuan Wang. Review on the Thermal Models Applications in the Reliability of Power Semiconductor Device. IET Power Electronics. 2025-01. https://doi.org/10.1049/pel2.70065