Buried‐Contact Organic Field‐Effect Transistor: The Way of Alleviating Drawbacks from Interfacial Charge Transfer
Taehoon Hwang; Jungyoon Seo; Dashdendev Tsogbayar; Eun Ko; Jisu Park; Yujeong Jeong; Songyeon Han; Hongdeok Kim; Joonmyung Choi; Hyungju Ahn; Jihoon Lee; Hyun Ho Choi; Hwa Sung Lee
- Published
- Publisher
- Wiley
- Journal / collection
- Advanced Functional Materials
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1002/adfm.202312232
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Cite this source
Taehoon Hwang; Jungyoon Seo; Dashdendev Tsogbayar; Eun Ko; Jisu Park; Yujeong Jeong; Songyeon Han; Hongdeok Kim; Joonmyung Choi; Hyungju Ahn; Jihoon Lee; Hyun Ho Choi; Hwa Sung Lee. Buried‐Contact Organic Field‐Effect Transistor: The Way of Alleviating Drawbacks from Interfacial Charge Transfer. Advanced Functional Materials. 2024-01-04. https://doi.org/10.1002/adfm.202312232