Analysis and Fault-Tolerant Operation of IGBT Multi Transistor Open Circuit Faults in DBSRC Converters
Yuhang Chi; Lu Zhao; Shi Cheng; Xue Liu; Zhenggang Yin
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IEEE 19th Conference on Industrial Electronics and Applications (ICIEA)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/iciea61579.2024.10664906
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Cite this source
Yuhang Chi; Lu Zhao; Shi Cheng; Xue Liu; Zhenggang Yin. Analysis and Fault-Tolerant Operation of IGBT Multi Transistor Open Circuit Faults in DBSRC Converters. 2024 IEEE 19th Conference on Industrial Electronics and Applications (ICIEA). 2024-08-05. https://doi.org/10.1109/iciea61579.2024.10664906