Weakly Supervised Image Segmentation for Detecting Defects from Scanning Electron Microscopy Images in Semiconductor
Younghwan Lee; Seoung Bum Kim
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Access
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/access.2024.3513873
The original publisher provides the full text and its access options.
Cite this source
Younghwan Lee; Seoung Bum Kim. Weakly Supervised Image Segmentation for Detecting Defects from Scanning Electron Microscopy Images in Semiconductor. IEEE Access. 2024. https://doi.org/10.1109/access.2024.3513873