PROCTOAI: Enhancing Exam Integrity with Machine Learning
Pratish Naganath Bamane; Yash Repal; Krushna Ingale; Pratish Bamane; Aniket Palkar; Saurabh Parchande
- Published
- Publisher
- SMS Institute of Technology
- Journal / collection
- SAMRIDDHI : A Journal of Physical Sciences, Engineering and Technology
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.18090/samriddhi.v16i02.01
The original publisher provides the full text and its access options.
Cite this source
Pratish Naganath Bamane; Yash Repal; Krushna Ingale; Pratish Bamane; Aniket Palkar; Saurabh Parchande. PROCTOAI: Enhancing Exam Integrity with Machine Learning. SAMRIDDHI : A Journal of Physical Sciences, Engineering and Technology. 2024-10-18. https://doi.org/10.18090/samriddhi.v16i02.01