Quality Control of Graphene Field-Effect Transistor Arrays Using Slit-Scanning Raman Microscopy
Shota Ushiba; Tomomi Nakano; Yuka Tokuda; Shinsuke Tani; Masahiko Kimura; Kazuhiko Matsumoto
- Published
- Publisher
- American Chemical Society (ACS)
- Research area
- Semiconductors
- Source type
- Preprint / posted paper
- DOI
- 10.26434/chemrxiv-2024-q0m2n
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Cite this source
Shota Ushiba; Tomomi Nakano; Yuka Tokuda; Shinsuke Tani; Masahiko Kimura; Kazuhiko Matsumoto. Quality Control of Graphene Field-Effect Transistor Arrays Using Slit-Scanning Raman Microscopy. American Chemical Society (ACS). 2024-11-21. https://doi.org/10.26434/chemrxiv-2024-q0m2n