The Influence of the Block Design on the I D -V D Curves of Power Transistor for E-SOA Characterization
Chun-Chih Chen; Shih-Chieh Chien; Chien-Wei Wang; Yu-Sheng Chiu; Jung-Tsun Chuang; Li-Fan Chen; Chieh-Yao Chuang; Jian-Hsing Lee
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/icce-taiwan62264.2024.10674276
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Cite this source
Chun-Chih Chen; Shih-Chieh Chien; Chien-Wei Wang; Yu-Sheng Chiu; Jung-Tsun Chuang; Li-Fan Chen; Chieh-Yao Chuang; Jian-Hsing Lee. The Influence of the Block Design on the I D -V D Curves of Power Transistor for E-SOA Characterization. 2024 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan). 2024-07-09. https://doi.org/10.1109/icce-taiwan62264.2024.10674276