High-throughput characterization is key to report reliable organic thin-film transistor performance
Joseph Manion; Benoît H. Lessard
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Nature Reviews Materials
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1038/s41578-024-00689-8
The original publisher provides the full text and its access options.
Cite this source
Joseph Manion; Benoît H. Lessard. High-throughput characterization is key to report reliable organic thin-film transistor performance. Nature Reviews Materials. 2024-05-08. https://doi.org/10.1038/s41578-024-00689-8