Exploring enhanced CNN for predicting semiconductor device health compared to support vector machine
C. V. S. Kumar; J. J. J. Sheela; N. Chandrasekharan
- Published
- Publisher
- AIP Publishing
- Journal / collection
- AIP Conference Proceedings
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1063/5.0229426
The original publisher provides the full text and its access options.
Cite this source
C. V. S. Kumar; J. J. J. Sheela; N. Chandrasekharan. Exploring enhanced CNN for predicting semiconductor device health compared to support vector machine. AIP Conference Proceedings. 2024. https://doi.org/10.1063/5.0229426