An On-Chip Circuit With Digital Output for Characterizing Transistor Current Mismatch Across Multiple Bias Conditions
Donghun Chung; Hyungyu Shim; Seungho Yu; Jaeha Kim
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Access
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/access.2025.3628656
The original publisher provides the full text and its access options.
Cite this source
Donghun Chung; Hyungyu Shim; Seungho Yu; Jaeha Kim. An On-Chip Circuit With Digital Output for Characterizing Transistor Current Mismatch Across Multiple Bias Conditions. IEEE Access. 2025. https://doi.org/10.1109/access.2025.3628656