Complexity Measurement and Optimization for Electronic Equipment Manufacturing Systems
Yunji Zhou; Jiancheng Shi; Yang Chen; Siqiao Liu; Jingxin Guan; Miao Yu
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 7th International Conference on Mechanical, Control and Computer Engineering (ICMCCE)
- Research area
- Industrial systems
- Source type
- Conference paper
- DOI
- 10.1109/icmcce63640.2024.11163488
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Cite this source
Yunji Zhou; Jiancheng Shi; Yang Chen; Siqiao Liu; Jingxin Guan; Miao Yu. Complexity Measurement and Optimization for Electronic Equipment Manufacturing Systems. 2024 7th International Conference on Mechanical, Control and Computer Engineering (ICMCCE). 2024-10-25. https://doi.org/10.1109/icmcce63640.2024.11163488