Reliability prediction of semiconductor devices based on GRU-LSTM neural network
Shufeng Tang; Xuesong Xie; Xiaoling Zhang
- Published
- Publisher
- SPIE
- Journal / collection
- International Conference on Optoelectronic Materials and Devices (ICOMD 2023)
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1117/12.3025192
The original publisher provides the full text and its access options.
Cite this source
Shufeng Tang; Xuesong Xie; Xiaoling Zhang. Reliability prediction of semiconductor devices based on GRU-LSTM neural network. International Conference on Optoelectronic Materials and Devices (ICOMD 2023). 2024-02-08. https://doi.org/10.1117/12.3025192