Abnormal Threshold Voltage Modulation Characteristics of Dual-Gate Ingazno Thin-Film Transistor with an Unisolated Top Gate
Chao Zhang; Menghan Qin; Yinghui Zhong; Xiao Dong Huang
- Published
- Publisher
- Elsevier BV
- Research area
- Semiconductors
- Source type
- Preprint / posted paper
- DOI
- 10.2139/ssrn.4922261
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Cite this source
Chao Zhang; Menghan Qin; Yinghui Zhong; Xiao Dong Huang. Abnormal Threshold Voltage Modulation Characteristics of Dual-Gate Ingazno Thin-Film Transistor with an Unisolated Top Gate. Elsevier BV. 2024. https://doi.org/10.2139/ssrn.4922261