LOW-FREQUENCY NOISE METER FOR SEMICONDUCTOR DEVICES
Ulyanovsk State Technical University; D.S. Grigorashin; O.A. Dulov; Ulyanovsk State Technical University
- Published
- Publisher
- Ulyanovsk State Technical University
- Journal / collection
- Materials of the 27th All-Russian Youth Scientific Conference
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.61527/appfe-2024.338-339
The original publisher provides the full text and its access options.
Cite this source
Ulyanovsk State Technical University; D.S. Grigorashin; O.A. Dulov; Ulyanovsk State Technical University. LOW-FREQUENCY NOISE METER FOR SEMICONDUCTOR DEVICES. Materials of the 27th All-Russian Youth Scientific Conference. 2024-10-21. https://doi.org/10.61527/appfe-2024.338-339